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求超聲波倒車(chē)?yán)走_(dá)相關(guān)外文文獻(xiàn)翻譯 3000字漢字

超聲波倒車(chē)?yán)走_(dá)的相關(guān)英文資料翻譯成中文,翻譯后的中文字?jǐn)?shù)是大于3000字。翻譯軟件效果太差,沒(méi)法用,希望有現(xiàn)成資料的朋友貼一個(gè)過(guò)來(lái),如果效果很好,在追加至少50幣子。非誠(chéng)勿擾: 問(wèn) 提問(wèn)者：網(wǎng)友 | 2017-06-12

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AT89C51的概況1 AT89C51應(yīng)用單片機(jī)是把主要計(jì)算機(jī)功能部件都集成在一塊芯片上的微型計(jì)算機(jī)。它是一種集計(jì)數(shù)和多中接口于一體的微控制器,被廣泛應(yīng)用在智能產(chǎn)品和工業(yè)自動(dòng)化上,而51單片機(jī)是個(gè)單片機(jī)中最為典型和最有代表性的一種。單片機(jī)廣泛應(yīng)用于商業(yè):諸如調(diào)制解調(diào)器,電動(dòng)機(jī)控制系統(tǒng),空調(diào)控制系統(tǒng),汽車(chē)發(fā)動(dòng)機(jī)和其他一些領(lǐng)域。這些單片機(jī)的高速處理速度和增強(qiáng)型外圍設(shè)備集合使得它們適合于這種高速事件應(yīng)用場(chǎng)合。然而,這些關(guān)鍵應(yīng)用領(lǐng)域也要求這些單片機(jī)高度可靠。強(qiáng)大的測(cè)試環(huán)境和用于驗(yàn)證這些無(wú)論在元部件層次還是系統(tǒng)級(jí)別的單片機(jī)的合適的工具環(huán)境保證了高可靠性和低市場(chǎng)風(fēng)險(xiǎn)。Intel 平臺(tái)工程部門(mén)開(kāi)發(fā)了一種面向?qū)ο蟮挠糜隍?yàn)證它的AT89C51 汽車(chē)單片機(jī)多線(xiàn)性測(cè)試環(huán)境。這種環(huán)境的目標(biāo)不僅是為AT89C51 汽車(chē)單片機(jī)提供一種強(qiáng)大測(cè)試環(huán)境,而且開(kāi)發(fā)一種能夠容易擴(kuò)展并重復(fù)用來(lái)驗(yàn)證其他幾種將來(lái)的單片機(jī)。開(kāi)發(fā)的這種環(huán)境連接了AT89C51。The General Situation of AT89C51Chapter 1 The application of AT89C51SCM is a major piece of computer components are integrated into the chip micro-computer. It is a multi-interface and counting on the micro-controller integration, and intelligence products are widely used in industrial automation. and MCS-51 microcontroller is a typical and representative.Microcontrollers are used in a multitude of commercial applications such as modems, motor-control systems, air conditioner control systems, automotive engine and among others. The high processing speed and enhanced peripheral set of these microcontrollers make them suitable for such high-speed event-based applications. However, these critical application domains also require that these microcontrollers are highly reliable. The high reliability and low market risks can be ensured by a robust testing process and a proper tools environment for the validation of these microcontrollers both at the component and at the system level. Intel Plaform Engineering department developed an object-oriented multi-threaded test environment for the validation of its AT89C51 automotive microcontrollers. The goals of thisenvironment was not only to provide a robust testing environment for the AT89C51 automotive microcontrollers, but to develop an environment which can be easily extended and reused for the validation of several other future microcontrollers. The environment was developed in conjunction with Microsoft Foundation Classes (AT89C51).: 回答者：網(wǎng)友

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